Theoretical Analysis of Hanbury Brown and Twiss Interferometry at Soft X-ray Free-Electron Lasers
arXiv:2104.04249 · doi:10.1103/PhysRevA.104.023508
Abstract
In this work we provide theoretical background for the analysis of second-order correlation functions in experiments performed at the soft x-ray free-electron lasers (XFELs). Typically, soft x-ray beamlines at XFELs are equipped by the variable line spacing (VLS) monochromators. We perform examination of the beam propagation through such VLS monochromator taking specially into account the interplay between the finite monochromator resolution and the exit slits width. We then provide general analysis of the second-order correlation intensities in spectral and spatial domains. Finally, we connect these functions with the statistical properties of the beam incoming to the monochromator unit in the limit of Gaussian Schell-model pulses.
arXiv comment26 pages, 2 figures, 34 references
References in corpus (7)
- Coherence Properties of Individual Femtosecond Pulses of an X-ray Free-Electron Laser
- Spatial and temporal coherence properties of single free-electron laser pulses
- Seeded x-ray free-electron laser generating radiation with laser statistical properties
- Hanbury Brown and Twiss interferometry at a free-electron laser
- Connecting field and intensity correlations: the Siegert relation and how to test it
- Statistical properties of a free-electron laser revealed by the Hanbury Brown and Twiss interferometry
- Thermodynamic Properties of Generalized Exclusion Statistics