Statistical properties of a free-electron laser revealed by the Hanbury Brown and Twiss interferometry
arXiv:1611.03996 · doi:10.1103/PhysRevA.95.023843
Abstract
We present a comprehensive experimental analysis of statistical properties of the self-amplified spontaneous emission (SASE) free-electron laser (FEL) FLASH at DESY in Hamburg by means of Hanbury Brown and Twiss (HBT) interferometry. The experiments were performed at the FEL wavelengths of 5.5 nm, 13.4 nm, and 20.8 nm. We determined the 2-nd order intensity correlation function for all wavelengths and different operation conditions of FLASH. In all experiments a high degree of spatial coherence (above 50%) was obtained. Our analysis performed in spatial and spectral domains provided us with the independent measurements of an average pulse duration of the FEL that were below 60 fs. To explain complicated behaviour of the 2-nd order intensity correlation function we developed advanced theoretical model that includes the presence of multiple beams and external positional jitter of the FEL pulses. By this analysis we determined that in most experiments several beams were present in radiating field and in one of the experiments external positional jitter was about 25% of the beam size. We envision that methods developed in our study will be used widely for analysis and diagnostics of the FEL radiation.
29 pages, 14 figures, 3 tables
References in corpus (4)
- Coherent control with a short-wavelength Free Electron Laser
- SASE FEL with energy-chirped electron beam and its application for generation of attosecond pulses
- The monochromator beamline at FLASH: performance, capabilities and upgrade plans
- Dynamics of colloidal crystals studied by pump-probe experiments at FLASH
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- Theoretical Analysis of Hanbury Brown and Twiss Interferometry at Soft X-ray Free-Electron Lasers
- FEL stochastic spectroscopy revealing silicon bond softening dynamics
- Multi-photon enhancement of the Schwinger pair production mechanism under strong FEL radiation
- Theory of parametric x-ray optical wavemixing processes