Using ${}^{22}$Na and ${}^{83\mathrm{m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon

Abstract

We have measured the properties of scintillation light in liquid argon doped with xenon concentrations from 165 ppm to 10,010 ppm using a ${}^{22}$Na source. The energy transfer processes in the xenon-doped liquid argon are discussed in detail, and a new waveform model is established and used to fit the average waveform. The time profile of the scintillation photon in the xenon-doped liquid argon and of the TPB emission are presented. The quantities of xenon-doped are controlled by a Mass Flow Controller which is calibrated via a Redusial Gas Analyzer to ensure that the xenon concentration is accurate. In addition, a successful test of ${}^{83\mathrm{m}}$Kr as a calibration source has been implemented in the xenon-doped liquid argon detector for the first time. By comparing the light yield of the ${}^{22}$Na and ${}^{83\mathrm{m}}$Kr, it can be concluded that the scintillation efficiency is almost same over the range of 41.5 keV to 511 keV.

17 pages, 16 figures