Hard and soft x-ray photoemission spectroscopy study of the new Kondo system SmO thin film
arXiv:2004.06315 · doi:10.1103/PhysRevMaterials.4.095001
Abstract
SmO thin film is a new Kondo system showing a resistivity upturn around 10 K and was theoretically proposed to have a topologically nontrivial band structure. We have performed hard x-ray and soft x-ray photoemission spectroscopy to elucidate the electronic structure of SmO. From the Sm 3 core-level spectra, we have estimated the valence of Sm to be 2.96, proving that the Sm has a mixed valence. The valence-band photoemission spectra exhibit a clear Fermi edge originating from the Sm 5-derived band. The present finding is consistent with the theory suggesting a possible topological state in SmO and show that rare-earth monoxides or their heterostructures can be a new playground for the interplay of strong electron correlation and spin-orbit coupling.
References in corpus (11)
- Superconducting proximity effect and Majorana fermions at the surface of a topological insulator
- Topological Kondo Insulators
- Correlated Topological Insulators with Mixed Valence
- Observation of in-gap surface states in the Kondo insulator SmB6 by photoemission
- Direct observation of the spin texture in strongly correlated SmB6 as evidence of the topological Kondo insulator
- Bulk and surface electronic properties of SmB6: a hard x-ray photoelectron spectroscopy study
- Topological properties and the dynamical crossover from mixed-valence to Kondo-lattice behavior in golden phase of SmS
- Electronic Structure of Ce-Doped and -Undoped NdCuO Superconducting Thin Films Studied by Hard X-ray Photoemission and Soft X-ray Absorption Spectroscopy
- SmO thin films: a flexible route to correlated flat bands with nontrivial topology
- Superconducting proximity effect in topological metals
- Multiple topological Dirac cones in a mixed-valent Kondo semimetal: g-SmS