Fluctuation-enhanced quantum metrology
arXiv:2003.13010
Abstract
The main obstacle for practical quantum technology is the noise, which can induce the decoherence and destroy the potential quantum advantages. The fluctuation of a field, which induces the dephasing of the system, is one of the most common noises and widely regarded as detrimental to quantum technologies. Here we show, contrary to the conventional belief, the fluctuation can be used to improve the precision limits in quantum metrology for the estimation of various parameters. Specifically, we show that for the estimation of the direction and rotating frequency of a field, the achieved precisions at the presence of the fluctuation can even surpass the highest precision achievable under the unitary dynamics which have been widely taken as the ultimate limit. We provide explicit protocols, which employs the adaptive quantum error correction, to achieve the higher precision limits with the fluctuating fields. Our study provides a completely new perspective on the role of the noises in quantum metrology. It also opens the door for higher precisions beyond the limit that has been believed to be ultimate.
arXiv comment17 pages, 7 figures
References in corpus (36)
- Advances in Quantum Metrology
- Quantum metrology
- On the Improvement of Frequency Stardards with Quantum Entanglement
- The elusive Heisenberg limit in quantum enhanced metrology
- Quantum Metrology in Non-Markovian Environments
- Quantum metrology with entangled coherent states
- Imaging with a small number of photons
- Quantum Theory of Superresolution for Two Incoherent Optical Point Sources
- Quantum Metrology with Two-Mode Squeezed Vacuum: Parity Detection Beats the Heisenberg Limit
- High Resolution Magnetic Resonance Spectroscopy Using Solid-State Spins
- Experimental realisation of quantum illumination
- Quantum Metrology for Gravitational Wave Astronomy
- Using entanglement against noise in quantum metrology
- Sub-millihertz magnetic spectroscopy with a nanoscale quantum sensor
- 'Designer atoms' for quantum metrology
- Improved quantum metrology using quantum error-correction
- Quantum Error Correction for Metrology
- Quantum Imaging
- Colloquium: Physics of optical lattice clocks
- Hamiltonian Learning and Certification Using Quantum Resources
- Optimal Quantum Clocks
- Increasing sensing resolution with error correction
- Optimal adaptive control for quantum metrology with time-dependent Hamiltonians
- Quantum metrology for a general Hamiltonian parameter
- Quantum metrology enhanced by repetitive quantum error correction
- Qubit noise spectroscopy for non-Gaussian dephasing environments
- Universal time scaling for Hamiltonian parameter estimation
- Nonlinear quantum metrology of many-body open systems
- Ancilla-free quantum error correction codes for quantum metrology
- The quantum Bell-Ziv-Zakai bounds and Heisenberg limits for waveform estimation
- Achieving optimal quantum acceleration of frequency estimation using adaptive coherent control
- Information Geometry of Complex Hamiltonians and Exceptional Points
- Maximal quantum Fisher information for general su(2) parametrization processes
- Heisenberg limited metrology using Quantum Error-Correction Codes
- Enhancing sensitivity in quantum metrology by Hamiltonian extensions
- Security against jamming and noise exclusion in imaging