X-ray Multimodal Intrinsic-Speckle-Tracking

Abstract

We develop X-ray Multi-modal Intrinsic-Speckle-Tracking (MIST), a form of X-ray speckle-tracking that is able to recover both the position-dependent phase shift and the position-dependent small-angle X-ray scattering (SAXS) signal of a phase object. MIST is based on combining a Fokker-Planck description of paraxial X-ray optics, with an optical-flow formalism for X-ray speckle-tracking. Only two images need to be taken in the presence of the sample, corresponding to two different transverse positions of the speckle-generating membrane, in order to recover both the refractive and local-SAXS properties of the sample. Like the optical-flow X-ray phase-retrieval method which it generalises, the MIST method implicitly rather than explicitly tracks both the transverse motion and the diffusion of speckles that is induced by the presence of a sample. Application to X-ray synchrotron data shows the method to be efficient, rapid and stable.

References in corpus (6)

• Single-Image Geometric-Flow X-Ray Speckle Tracking
• X-ray Fokker--Planck equation for paraxial imaging
• Single-shot x-ray speckle-based imaging of a single-material object
• Dark-field signal extraction in propagation-based phase-contrast imaging
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Cited by in corpus (9)

• X-ray phase-contrast imaging: a broad overview of some fundamentals
• High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model
• Quantifying the x-ray dark-field signal in single-grid imaging
• Single-exposure x-ray dark-field imaging: quantifying sample microstructure using a single-grid setup
• Paraxial diffusion-field retrieval
• X-ray dark-field via spectral propagation-based imaging
• Speckle-based X-ray microtomography via preconditioned Wirtinger flow
• Directional dark-field implicit x-ray speckle tracking using an anisotropic-diffusion Fokker-Planck equation
• Low-exposure, high-quality multimodal speckle X-ray imaging via an intrinsic gradient-flow approach