Probing Qubit Memory Errors at the Part-per-Million Level

Abstract

Robust qubit memory is essential for quantum computing, both for near-term devices operating without error correction, and for the long-term goal of a fault-tolerant processor. We directly measure the memory error ${\epsilon }_m$ for a ${}^{43}$Ca${}^{+}$ trapped-ion qubit in the small-error regime and find ${\epsilon }_m<10^{-4}$ for storage times $t\lesssim50\,\mbox{ms}$. This exceeds gate or measurement times by three orders of magnitude. Using randomized benchmarking, at $t=1\,\mbox{ms}$ we measure ${\epsilon }_m=1.2(7)\times 10^{-6}$, around ten times smaller than that extrapolated from the $T_2^{\ast }$ time, and limited by instability of the atomic clock reference used to benchmark the qubit.

8 pages, 5 figures

References in corpus (22)

• Surface codes: Towards practical large-scale quantum computation
• Experimental issues in coherent quantum-state manipulation of trapped atomic ions
• Randomized Benchmarking of Quantum Gates
• High-fidelity quantum logic gates using trapped-ion hyperfine qubits
• High-fidelity two-qubit quantum logic gates using trapped calcium-43 ions
• Keeping a Quantum Bit Alive by Optimized $\pi$-Pulse Sequences
• Optimized Dynamical Decoupling in a Model Quantum Memory
• High-fidelity preparation, gates, memory and readout of a trapped-ion quantum bit
• High-Fidelity Universal Gate Set for ${}^9$Be${}^{+}$ Ion Qubits
• Scalable Noise Estimation with Random Unitary Operators
• Room temperature quantum bit storage exceeding 39 minutes using ionized donors in 28-silicon
• Long-lived qubit memory using atomic ions
• Microwave quantum logic gates for trapped ions
• Single-qubit quantum memory exceeding $10$-minute coherence time
• Fast quantum logic gates with trapped-ion qubits
• Trapped-ion quantum logic gates based on oscillating magnetic fields
• High-fidelity trapped-ion quantum logic using near-field microwaves
• Qubit metrology of ultralow phase noise using randomized benchmarking
• Magnetic field stabilization system for atomic physics experiments
• Keeping a Single Qubit Alive by Experimental Dynamic Decoupling
• A microfabricated ion trap with integrated microwave circuitry
• High-Speed Low-Crosstalk Detection of a ${}^{171}$Yb${}^{+}$ Qubit using Superconducting Nanowire Single Photon Detectors

Cited by in corpus (20)

• Single ion-qubit exceeding one hour coherence time
• High-rate, high-fidelity entanglement of qubits across an elementary quantum network
• Towards real-world quantum networks: a review
• Microwaves in Quantum Computing
• Robust Quantum Memory in a Trapped-Ion Quantum Network Node
• Benchmarking a high-fidelity mixed-species entangling gate
• How to wire a 1000-qubit trapped ion quantum computer
• Fast, high-fidelity addressed single-qubit gates using efficient composite pulse sequences
• Modeling Noisy Quantum Circuits Using Experimental Characterization
• Eliminating Leakage Errors in Hyperfine Qubits
• Single-qubit gates with errors at the $10^{-7}$ level
• Scalable, high-fidelity all-electronic control of trapped-ion qubits
• Scalable hyperfine qubit state detection via electron shelving in the ${}^2$D${}_{5/2}$ and ${}^2$F${}_{7/2}$ manifolds in ${}^{171}$Yb${}^{+}$
• Cryogenic ion trap system for high-fidelity near-field microwave-driven quantum logic
• Optimization and implementation of a surface-electrode ion trap junction
• Improving trapped-ion-qubit memories via code-mediated error-channel balancing
• Space-time tradeoff in networked virtual distillation
• Combining processing throughput, low latency and timing accuracy in experiment control
• Polarisation-insensitive state preparation for trapped-ion hyperfine qubits
• An optically-heated atomic source for compact ion trap vacuum systems