Effect of synthesis conditions on the electrical resistivity of TiSe
arXiv:1903.12375 · doi:10.1103/PhysRevMaterials.3.084005
Abstract
Dilute impurities and growth conditions can drastically affect the transport properties of TiSe, especially below the charge density wave transition. In this paper, we discuss the effects of cooling rate, annealing time and annealing temperature on the transport properties of TiSe: slow cooling of polycrystalline TiSe post-synthesis drastically increases the low temperature resistivity, which is in contrast to the metallic behavior of single-crystalline TiSe due to charge doping from the residual iodine transport agent. A logarithmic increase of resistivity upon cooling and negative magnetoresistance with a sharp cusp around zero field are observed for the first time for the polycrystalline TiSe samples, pointing to weak-localization effects due to low dimensionality. Annealing at low temperatures has a similar, but less drastic effect. Furthermore, rapid quenching of the polycrystalline samples from high temperatures freezes in disorder, leading to a decrease in the low temperature resistivity.
arXiv comment8 pages, 6 figures
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Cited by in corpus (8)
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- A Pathway to Efficient Simulations of Charge Density Waves in Transition Metal Dichalcogenides: A Case Study for TiSe2
- Peculiarities of electron transport and resistive switching in point contacts on TiSe2, TiSeS and CuxTiSe2
- Symmetry-mode analysis for local structure investigations using pair distribution function data
- Evidence of anisotropic three-dimensional weak-localization in TiSe nanoflakes
- Melting point depression of charge density wave in 1T-TiSe due to size effects
- Metal-to-insulator transition in Pt-doped TiSe driven by emergent network of narrow transport channels