Structural, magnetic, and electrical properties of collinear antiferromagnetic heteroepitaxy cubic MnGa thin films
arXiv:1901.09524 · doi:10.1063/1.5088790
Abstract
Although a cubic phase of MnGa with an antiferromagnetic order has been theoretically predicted, it has not been experimentally verified in a bulk or film form. Here, we report the structural, magnetic, and electrical properties of antiferromagnetic cubic MnGa (C-MnGa) thin films, in comparison with ferrimagnetic tetragonal MnGa (T-Mn3Ga). The structural analyses reveal that C-MnGa is hetero-epitaxially grown on MgO substrate with the CuAu-type cubic structure, which transforms to T-MnGa as the RF sputtering power increases. The magnetic and magnetotransport data show the antiferromagnetic transition at T = 400 K for C-MnGa and the ferrimagnetic transition at T = 820 K for T-MnGa. Furthermore, we find that the antiferromagnetic C-MnGa exhibits a higher electrical resistivity than the ferrimagnetic T-MnGa, which can be understood by spin-dependent scattering mechanism.
arXiv comment15 pages, 4 figures
References in corpus (6)
- Calculated electronic and magnetic properties of the half-metallic, transition metal based Heusler compounds
- High spin polarization in epitaxial films of ferrimagnetic Mn3Ga
- Heusler 4.0: Tunable Materials
- Guidelines for understanding cubic manganese-rich Heusler compounds
- Magnetism in tetragonal manganese-rich Heusler compounds
- Electron interaction with domain walls in antiferromagnetically coupled multilayers