Interferometric evanescent wave excitation of nano-antenna for ultra-sensitive displacement and phase metrology

Abstract

We propose a method for ultra-sensitive displacement and phase metrology based on the interferometric evanescent wave excitation of nano-antennas. We show that with a proper choice of nano-antenna, tiny displacements or relative phase variations can be converted into sensitive scattering direction changes in the Fourier $k$-space. These changes stem from the strong position dependence of the imaginary Poynting vector orientation within interfering evanescent waves. Using strongly-evanescent standing waves, high sensitivity is achieved in the nano-antenna's zero scattering direction, which varies linearly with displacement over a long range. With weakly-evanescent wave interference, even higher sensitivity to tiny displacement or phase changes can be reached around chosen location. The high sensitivity of the proposed method can form the basis for many applications.

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Cited by in corpus (9)

• Observation of high-order imaginary Poynting momentum optomechanics in structured light
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• Mapping the near-field spin angular momenta in the structured surface plasmon polaritons field
• Far-field and near-field directionality in acoustic scattering
• Optical Fingerprint of Flat Substrate Surface and Marker-free Lateral Displacement Detection with Angstrom-level Precision
• Fisher-Information Efficient Metagratings for Transverse Displacement Metrology at the Measurement Independent Shot-Noise Limit
• Broadband Control on Scattering Events with Interferometric Coherent Waves
• Resolving Complex Subwavelength Grating Structures Using Topologically Structured Light
• Linear control of light scattering with multiple coherent light excitation