Simultaneous measurement of multiple parameters of a subwavelength structure based on the weak value formalism

Abstract

A mathematical extension of the weak value formalism to the simultaneous measurement of multiple parameters is presented in the context of an optical focused vector beam scatterometry experiment. In this example, preselection and postselection are achieved via spatially-varying polarization control, which can be tailored to optimize the sensitivity to parameter variations. Initial experiments for the two-parameter case demonstrate that this method can be used to measure physical parameters with resolutions at least 1000 times smaller than the wavelength of illumination.

References in corpus (5)

• Ultrasensitive Beam Deflection Measurement via Interferometric Weak Value Amplification
• The analogy between optical beam shifts and quantum weak measurements
• New wine in old bottles: Quantum measurement - direct, indirect, weak - with some applications
• Observing angular deviations in light beam reflection via weak measurements
• Tutorial: Maximum likelihood estimation in the context of an optical measurement

Cited by in corpus (5)

• Ultra-sensitive measurement of transverse displacements with structured light
• Enhanced weak-value amplification via photon recycling
• High Precision Multi-parameter Weak Measurement with Hermite-Gaussian Pointer
• Disembodiment of arbitrary number of properties in quantum Cheshire cat experiment
• Multiparameter quantum metrology with postselection measurements