Redox reaction enhanced Schottky contact at a \LNO{}(001)/Al interface

Abstract

Emergent phenomena at interfaces between oxides and metals can appear due to charge transfer and mass transport that modify the bulk properties. By coating the metallic oxide LaNiO${}_3$ by aluminium, we fabricated a junction exhibiting a diode-like behaviour. At the equilibrium, the interface is insulating. The metallic behaviour can be recovered by applying a voltage drop across the junction in one polarity only. The electrical properties in direct and reverse bias are investigated. The observed electro-resistive effect rises up to $10^5$ \% and can be interpreted in terms of (i) a spontaneous redox reaction occurring at the interface and (ii) its reversal induced by charge injection in direct bias.