Efficient illumination angle self-calibration in Fourier ptychography

Abstract

Fourier ptychography captures intensity images with varying source patterns (illumination angles) in order to computationally reconstruct large space-bandwidth-product images. Accurate knowledge of the illumination angles is necessary for good image quality; hence, calibration methods are crucial, despite often being impractical or slow. Here, we propose a fast, robust, and accurate self-calibration algorithm that uses only experimentally-collected data and general knowledge of the illumination setup. First, our algorithm makes a direct estimate of the brightfield illumination angles based on image processing. Then, a more computationally-intensive spectral correlation method is used inside the iterative solver to further refine the angle estimates of both brightfield and darkfield images. We demonstrate our method for correcting large and small misalignment artifacts in both 2D and 3D Fourier ptychography with different source types: an LED array, a galvo-steered laser, and a high-NA quasi-dome LED illuminator.

arXiv comment8 pages, 7 figures

References in corpus (6)

• Wide-field, high-resolution Fourier ptychographic microscopy
• Quantitative phase imaging via Fourier ptychographic microscopy
• Experimental robustness of Fourier Ptychography phase retrieval algorithms
• Computational illumination for high-speed in vitro Fourier ptychographic microscopy
• System calibration method for Fourier ptychographic microscopy
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Cited by in corpus (7)

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• PtyLab.m/py/jl: a cross-platform, open-source inverse modeling toolbox for conventional and Fourier ptychography
• Parallelized aperture synthesis using multi-aperture Fourier ptychographic microscopy
• Addressing phase-curvature in Fourier ptychography
• Synthetic aperture interference light (SAIL) microscopy for high-throughput label-free imaging
• Pose correction scheme for camera-scanning Fourier ptychography based on camera calibration and homography transform