Quantitative phase imaging via Fourier ptychographic microscopy

Abstract

Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system performance beyond the limit defined by its optical elements. The FPM technique applies a novel phase retrieval procedure to achieve both resolution enhancement and complex image recovery. In this letter, we compare FPM data to both theoretical prediction and phase-shifting digital holography measurement to show that its acquired phase maps are quantitative and artifact-free. We additionally explore the relationship between the achievable spatial and optical thickness resolution offered by a reconstructed FPM phase image. We conclude by demonstrating both enhanced visualization and the collection of otherwise unobservable sample information using FPM quantitative phase.

4 pages, 5 figures

References in corpus (3)

• Wide-field, high-resolution Fourier ptychographic microscopy
• X-ray image reconstruction from a diffraction pattern alone
• Coherent methods in the X-ray sciences

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