Ultimate phase estimation in a squeezed-state interferometer using photon counters with a finite number resolution
arXiv:1801.00555 · doi:10.1088/1751-8121/aa86c0
Abstract
Photon counting measurement has been regarded as the optimal measurement scheme for phase estimation in the squeezed-state interferometry, since the classical Fisher information equals to the quantum Fisher information and scales as for given input number of photons . However, it requires photon-number-resolving detectors with a large enough resolution threshold. Here we show that a collection of -photon detection events for up to the resolution threshold can result in the ultimate estimation precision beyond the shot-noise limit. An analytical formula has been derived to obtain the best scaling of the Fisher information.
one column, 15 pages, 3 figures
References in corpus (17)
- Quantum metrology from a quantum information science perspective
- Quantum Optical Metrology -- The Lowdown on High-N00N States
- Optimal Quantum Phase Estimation
- Observation of squeezed light with 10dB quantum noise reduction
- Mach-Zehnder Interferometry at the Heisenberg Limit with coherent and squeezed-vacuum light
- Fisher information under decoherence in Bloch representation
- An avalanche-photodiode-based photon-number-resolving detector
- Quantum Metrological Limits via a Variational Approach
- Phase detection at the quantum limit with multi-photon Mach-Zehnder interferometry
- High photon number path entanglement in the interference of spontaneously downconverted photon pairs with coherent laser light
- Optimal Quantum-Enhanced Interferometry
- Optical interferometry in the presence of large phase diffusion
- Enhanced interferometry using squeezed thermal states and even or odd states
- Quantum-limited metrology in the presence of collisional dephasing
- Quantum interferometry with binary-outcome measurements in the presence of phase diffusion
- Fisher information of a squeezed-state interferometer with a finite photon-number resolution
- Heisenberg-limited metrology with information recycling