Fabrication of grain boundary junctions using NdFeAs(O,F) superconducting thin films
arXiv:1712.05966 · doi:10.1088/1742-6596/1054/1/012024
Abstract
We report on the growth of NdFeAs(O,F) thin films on [001]-tilt MgO bicrystal substrates with misorientation angle theta_GB=6°, 12°, 24° and 45°, and their inter- and intra-grain transport properties. X-ray diffraction study confirmed that all our NdFeAs(O,F) films are epitaxially grown on the MgO bicrystals. The theta_GB dependence of the inter-grain critical current density Jc shows that, unlike Co-doped BaFe2As2 and Fe(Se,Te), its decay with theta_GB is rather significant. As a possible reason of this result, fluorine may have diffused preferentially to the grain boundary region and eroded the crystal structure.
arXiv commentProceedings of the 30th International Symposium on Superconductivity, 7 figures. Accepted for publication
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Cited by in corpus (4)
- Fe-based superconducting thin films on metallic substrates: growth, characteristics and relevant properties
- Grain boundary characteristics of Fe-based superconductors
- Structural analysis and transport properties of [010]-tilt grain boundaries in Fe(Se,Te)
- Grain boundary characteristics of oxypnictide NdFeAs(O,F) superconductors