Electrostatic Modulation of the Electronic Properties of Dirac Semimetal Na3Bi
arXiv:1707.09286 · doi:10.1103/PhysRevMaterials.1.054203
Abstract
Large-area thin films of topological Dirac semimetal NaBi are grown on amorphous SiO:Si substrates to realise a field-effect transistor with the doped Si acting as back gate. As-grown films show charge carrier mobilities exceeding 7,000 cm/Vs and carrier densities below 3 10 cm, comparable to the best thin-film NaBi. An ambipolar field effect and minimum conductivity are observed, characteristic of Dirac electronic systems. The results are quantitatively understood within a model of disorder-induced charge inhomogeneity in topological Dirac semimetals. Due to the inverted band structure, the hole mobility is significantly larger than the electron mobility in NaBi, and when present, these holes dominate the transport properties.
arXiv comment5 pages, 4 figures; minor corrections and revisions for readability
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Cited by in corpus (6)
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- Electron Transport in Dirac and Weyl Semimetals
- Progress in epitaxial thin-film Na3Bi as a topological electronic material
- Signatures of Helical Edge Transport in Millimetre-Scale Thin Films of Na3Bi
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