Angle-resolved x-ray spectroscopic scheme to determine overlapping hyperfine splittings in highly charged helium-like ions
arXiv:1707.03152 · doi:10.1103/PhysRevA.96.012503
Abstract
An angle-resolved x-ray spectroscopic scheme is presented for determining the hyperfine splitting of highly charged ions. For helium-like ions, in particular, we propose to measure either the angular distribution or polarization of the emission following the stimulated decay of the initial level. It is found that both the angular and polarization characteristics of the emitted x-ray photons strongly depends on the (relative) \textit{splitting} of the partially overlapping hyperfine resonances and may thus help resolve their hyperfine structure. The proposed scheme is feasible with present-day photon detectors and allows a measurement of the hyperfine splitting of helium-like ions with a relative accuracy of about .
5 pages, 3 figures
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