Initial pseudo-steady state & asymptotic KPZ universality in semiconductor on polymer deposition

Abstract

The Kardar-Parisi-Zhang (KPZ) class is a paradigmatic example of universality in nonequilibrium phenomena, but clear experimental evidences of asymptotic 2D-KPZ statistics are still very rare, and far less understanding stems from its short-time behavior. We tackle such issues by analyzing surface fluctuations of CdTe films deposited on polymeric substrates, based on a huge spatio-temporal surface sampling acquired through atomic force microscopy. A \textit{pseudo}-steady state (where average surface roughness and spatial correlations stay constant in time) is observed at initial times, persisting up to deposition of $\sim 10^4$ monolayers. This state results from a fine balance between roughening and smoothening, as supported by a phenomenological growth model. KPZ statistics arises at long times, thoroughly verified by universal exponents, spatial covariance and several distributions. Recent theoretical generalizations of the Family-Vicsek scaling and the emergence of log-normal distributions during interface growth are experimentally confirmed. These results confirm that high vacuum vapor deposition of CdTe constitutes a genuine 2D-KPZ system, and expand our knowledge about possible substrate-induced short-time behaviors.

13 pages, 8 figures, 2 tables

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• The hidden fluctuation-dissipation theorem for growth
• Geometric and chemical non-uniformity may induce the stability of more than one wetting state in the same hydrophobic surface
• Dimensional crossover in Kardar-Parisi-Zhang growth