paper

Resonant x-ray spectroscopy of uranium intermetallics at the U edges

arXiv:1706.02920 · doi:10.1103/PhysRevB.95.245103

Abstract

We present resonant x-ray emission spectroscopic (RXES) data from the uranium intermetallics UPd, USb, USn and URuSi, at the U edges and compare the data to those from the well-localized semiconductor UO. The technique is especially sensitive to any oxidation of the surface, and this was found on the USb sample, thus preventing a good comparison with a material known to be . We have found a small energy shift between UO and UPd, both known to have localized configurations, which we ascribe to the effect of conduction electrons in UPd. The spectra from UPd and URuSi,are similar, strongly suggesting a predominant configuration for URuSi. The valence-band resonant inelastic x-ray scattering (RIXS) provides information on the U transitions (at about ~eV) between the U and U states, as well as transitions of between and ~eV from the valence band into the unoccupied states. These transitions are primarily involving mixed ligand states (O or Pd, Ru ) and U states. Calculations are able to reproduce both these low-energy transitions reasonably well.

11 pages, 8 figures

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Resonant x-ray spectroscopy of uranium intermetallics at the U $M_{4,5}$ edges · wovepaper