Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime
arXiv:1706.02628 · doi:10.1063/1.5003391
Abstract
Shot noise measurements on atomic and molecular junctions provide rich information about the quantum transport properties of the junctions and on the inelastic scattering events taking place in the process. Dissipation at the nanoscale, a problem of central interest in nano-electronics, can be studied in its most explicit and simplified form. Here, we describe a measurement technique that permits extending previous noise measurements to a much higher frequency range, and to much higher bias voltage range, while maintaining a high accuracy in noise and conductance. We also demonstrate the advantages of having access to the spectral information for diagnostics.
8 figures
References in corpus (7)
- Highly conductive molecular junctions based on direct binding of benzene to platinum electrodes
- Phonon-assisted current noise in molecular junctions
- Electron-phonon interaction and full counting statistics in molecular junctions
- Charge transfer statistics of a molecular quantum dot with a vibrational degree of freedom
- A system for measuring auto- and cross-correlation of current noise at low temperatures
- Shot noise suppression at room temperature in atomic-scale Au junctions
- A high sensitivity ultra-low temperature RF conductance and noise measurement setup