Test of Ultra Fast Silicon Detectors for Picosecond Time Measurements with a New Multipurpose Read-Out Board

Abstract

Ultra Fast Silicon Detectors (UFSD) are sensors optimized for timing measurements employing a thin multiplication layer to increase the output signal. A multipurpose read-out board hosting a low-cost, low-power fast amplifier was designed at the University of Kansas and tested at the European Organization for Nuclear Research (CERN) using a 180 GeV pion beam. The amplifier has been designed to read out a wide range of detectors and it was optimized in this test for the UFSD output signal. In this paper we report the results of the experimental tests using 50 $\mu \mathrm{m}$ thick UFSD with a sensitive area of 1.4 $\mathrm{m}{\mathrm{m}}^2$. A timing precision below 30 ps was achieved.

References in corpus (2)

• Beam test results of a 16 ps timing system based on ultra-fast silicon detectors
• Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC waveform digitizer

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