System calibration method for Fourier ptychographic microscopy

Abstract

Fourier ptychographic microscopy (FPM) is a recently proposed quantitative phase imaging technique with high resolution and wide field-of-view (FOV). In current FPM imaging platforms, systematic error sources come from the aberrations, LED intensity fluctuation, parameter imperfections and noise, which will severely corrupt the reconstruction results with artifacts. Although these problems have been researched and some special methods have been proposed respectively, there is no method to solve all of them. However, the systematic error is a mixture of various sources in the real situation. It is difficult to distinguish a kind of error source from another due to the similar artifacts. To this end, we report a system calibration procedure, termed SC-FPM, based on the simulated annealing (SA) algorithm, LED intensity correction and adaptive step-size strategy, which involves the evaluation of an error matric at each iteration step, followed by the re-estimation of accurate parameters. The great performance has been achieved both in simulation and experiments. The reported system calibration scheme improves the robustness of FPM and relaxes the experiment conditions, which makes the FPM more pragmatic.

18 pages, 9 figures

References in corpus (8)

• Wide-field, high-resolution Fourier ptychographic microscopy
• Experimental robustness of Fourier Ptychography phase retrieval algorithms
• Computational illumination for high-speed in vitro Fourier ptychographic microscopy
• Spectrum multiplexing and coherent-state decomposition in Fourier ptychographic imaging
• Fourier ptychographic reconstruction using Wirtinger flow optimization
• Content adaptive sparse illumination for Fourier ptychography
• Fourier ptychographic reconstruction using Poisson maximum likelihood and truncated Wirtinger gradient
• Motion-corrected Fourier ptychography

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• In situ correction of liquid meniscus in cell culture imaging system based on parallel Fourier ptychographic microscopy (96 Eyes)
• Coherent synthetic aperture imaging for visible remote sensing via reflective Fourier ptychography