Increased low-temperature damping in yttrium iron garnet thin films
arXiv:1612.01954 · doi:10.1103/PhysRevB.95.174411
Abstract
We report measurements of the frequency and temperature dependence of ferromagnetic resonance (FMR) for a 15-nm-thick yttrium iron garnet (YIG) film grown by off-axis sputtering. Although the FMR linewidth is narrow at room temperature (corresponding to a damping coefficient = (9.0 0.2) ), comparable to previous results for high-quality YIG films of similar thickness, the linewidth increases strongly at low temperatures, by a factor of almost 30. This increase cannot be explained as due to two-magnon scattering from defects at the sample interfaces. We argue that the increased low-temperature linewidth is due to impurity relaxation mechanisms that have been investigated previously in bulk YIG samples. We suggest that the low-temperature linewidth is a useful figure of merit to guide the optimization of thin-film growth protocols because it is a particularly sensitive indicator of impurities.
arXiv comment14 pages, 5 figures
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