The decay width in the SMEFT: and corrections at one loop
arXiv:1611.09879 · doi:10.1007/JHEP03(2017)060
Abstract
We calculate one loop and dependent corrections to and the partial widths due to dimension six operators in the Standard Model Effective Field Theory (SMEFT), including finite terms. We assume symmetry and a symmetry in the UV matching onto the dimension six operators, dominantly broken by the Standard Model Yukawa matrices. Corrections to these observables are predicted using the input parameters extracted with one loop corrections in the same limit. We show that at one loop the number of SMEFT parameters contributing to the precise LEPI pseudo-observables exceeds the number of measurements. As a result the SMEFT parameters contributing to LEP data are formally unbounded when the size of loop corrections are reached until other data is considered in a global analysis. The size of these loop effects is generically a correction of order to leading effects in the SMEFT, but we find multiple large numerical coefficients in our calculation at this order. We use a scheme, modified for the SMEFT, for renormalization. Some subtleties involving novel evanescent scheme dependence present in this result are explained.
38 pages + refs, 11 figures, v3: Acknowledgement updated with grant numbers
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