Comparison of the dislocation density obtained by HR-EBSD and X-ray profile analysis

Abstract

Based on the cross correlation analysis of the Kikuchi diffraction patterns high-resolution EBSD is a well established method to determine the internal stress in deformed crystalline materials. In many cases, however, the stress values obtained at the different scanning points have a large (in the order of GPa) scatter. As it was first demonstrated by Wilkinson and co-workers this is due to the long tail of the probability distribution of the internal stress ($P(\sigma )$) generated by the dislocations present in the system. According to the theoretical investigations of Groma and co-workers the tail of $P(\sigma )$ is inverse cubic with prefactor proportional to the total dislocation density $<\rho >$. In this paper we present a direct comparison of the X-ray line broadening and $P(\sigma )$ obtained by EBSD on deformed Cu single crystals. It is shown that $<\rho >$ can be determined from $P(\sigma )$. This opens new perspectives for the application of EBSD in determining mesoscale parameters in a heterogeneous sample.

5 pages, 6 figures

References in corpus (2)

• Submicron plasticity: yield stress, dislocation avalanches, and velocity distribution
• Local density approximation for the energy functional of three-dimensional dislocation systems

Cited by in corpus (6)

• Machine learning plastic deformation of crystals
• Investigation of geometrically necessary dislocation structures in compressed Cu micropillars by 3-dimensional HR-EBSD
• Applications of Multivariate Statistical Methods and Simulation Libraries to Analysis of Electron Backscatter Diffraction and Transmission Kikuchi Diffraction Datasets
• Dislocation interactions in olivine control postseismic creep of the upper mantle
• Grain-size effects during semi-brittle flow of calcite rocks
• Dislocation correlations in GaN epitaxial films revealed by EBSD and XRD