Insights into ultrafast Ge-Te bond dynamics in a phase-change superlattice
arXiv:1605.08157 · doi:10.1103/PhysRevB.94.094310
Abstract
A long-standing question for avant-grade data storage technology concerns the nature of the ultrafast photoinduced phase transformations in the wide class of chalcogenide phase-change materials (PCMs). Overall, a comprehensive understanding of the microstructural evolution and the relevant kinetics mechanisms accompanying the out-of-equilibrium phases is still missing. Here, after overheating a phase-change chalcogenide superlattice by an ultrafast laser pulse, we indirectly track the lattice relaxation by time resolved X-ray absorption spectroscopy (tr-XAS) with a sub-ns time resolution. The novel approach to the tr-XAS experimental results reported in this work provides an atomistic insight of the mechanism that takes place during the cooling process, meanwhile a first-principles model mimicking the microscopic distortions accounts for a straightforward representation of the observed dynamics. Finally, we envisage that our approach can be applied in future studies addressing the role of dynamical structural strain in phase-change materials.
References in corpus (5)
- Time-Domain Separation of Optical Properties From Structural Transitions in Resonantly Bonded Materials
- Sub-nanometre resolution of atomic motion during electronic excitation in phase-change materials
- Picosecond strain dynamics in GeSbTe monitored by time-resolved x-ray diffraction
- Polarization Dependent Optical Control of Atomic Arrangement in Multilayer Ge-Sb-Te Phase Change Materials
- Interband characterization and electronic transport control of nanoscaled GeTe/SbTe superlattices