Multi-parameter Quantum Metrology
arXiv:1604.02615 · doi:10.1080/23746149.2016.1230476
Abstract
The simultaneous quantum estimation of multiple parameters can provide a better precision than estimating them individually. This is an effect that is impossible classically. We review the rich background of multi-parameter quantum metrology, some of the main results in the field and its recent advances. We close by highlighting future challenges and open questions.