paper

Multi-parameter Quantum Metrology

arXiv:1604.02615 · doi:10.1080/23746149.2016.1230476

Abstract

The simultaneous quantum estimation of multiple parameters can provide a better precision than estimating them individually. This is an effect that is impossible classically. We review the rich background of multi-parameter quantum metrology, some of the main results in the field and its recent advances. We close by highlighting future challenges and open questions.

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