Measurement of radioactive contamination in the high-resistivity silicon CCDs of the DAMIC experiment
arXiv:1506.02562 · doi:10.1088/1748-0221/10/08/P08014
Abstract
We present measurements of radioactive contamination in the high-resistivity silicon charge-coupled devices (CCDs) used by the DAMIC experiment to search for dark matter particles. Novel analysis methods, which exploit the unique spatial resolution of CCDs, were developed to identify and particles. Uranium and thorium contamination in the CCD bulk was measured through spectroscopy, with an upper limit on the U (Th) decay rate of 5 (15) kg d at 95% CL. We also searched for pairs of spatially correlated electron tracks separated in time by up to tens of days, as expected from Si-P or Pb-Bi sequences of decays. The decay rate of Si was found to be kg d (95% CI). An upper limit of 35 kg d (95% CL) on the Pb decay rate was obtained independently by spectroscopy and the decay sequence search. These levels of radioactive contamination are sufficiently low for the successful operation of CCDs in the forthcoming 100 g DAMIC detector.
18 pages, 20 figures
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Cited by in corpus (19)
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