Resonant inelastic x-ray scattering spectrometer with 25 meV resolution at Cu K-edge
arXiv:1412.4484 · doi:10.1107/S1600577515009686
Abstract
An unparalleled resolution is reported with an inelastic x-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single crystal quartz (SiO_{2}) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray tracing simulation of an ideal spectrometer. We demonstrated the performance of the spectrometer by reproducing the phonon dispersion curve of a beryllium (Be) single crystal.
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- Resonant inelastic x-ray scattering study of vector chiral ordered kagome antiferromagnet
- Detecting Crystallographic Lattice Chirality using Resonant Inelastic X-ray Scattering