Observation of phonons with resonant inelastic x-ray scattering
arXiv:1009.4356 · doi:10.1088/0953-8984/22/48/485601
Abstract
Phonons, the quantum mechanical representation of lattice vibrations, and their coupling to the electronic degrees of freedom are important for understanding thermal and electric properties of materials. For the first time, phonons have been measured using resonant inelastic x-ray scattering (RIXS) across the Cu K-edge in cupric oxide (CuO). Analyzing these spectra using an ultra-short core-hole lifetime approximation and exact diagonalization techniques, we can explain the essential inelastic features. The relative spectral intensities are related to the electron-phonon coupling strengths.
11 pages, 3 figures
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Cited by in corpus (9)
- Exploring Quantum Materials with Resonant Inelastic X-Ray Scattering
- Resonant inelastic x-ray scattering spectrometer with 25 meV resolution at Cu K-edge
- Probing electron-phonon interactions away from the Fermi level with resonant inelastic x-ray scattering
- Magnon-phonon coupling effects on the indirect K-edge resonant inelastic X-ray scattering spectrum of a 2D Heisenberg antiferromagnet
- Beyond the single-site approximation modeling of electron-phonon coupling effects on resonant inelastic X-ray scattering spectra
- Spin Dynamics and Resonant Inelastic X-ray Scattering in Chromium with Commensurate Spin-Density Wave Order
- Theory of electron-phonon interactions in extended correlated systems probed by resonant inelastic x-ray scattering
- Polarization dependency in Resonant Inelastic X-Ray Scattering
- Low-energy electronic interactions in ferrimagnetic Sr2CrReO6 thin films