Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration
arXiv:1410.3233 · doi:10.1016/j.tsf.2013.11.055
Abstract
In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.
in press, Thin Solid Films