3 citations · 6 across the 4 of their papers we have counts for
4 papers
Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry
Tivadar Lohner, Attila Nemeth, Zsolt Zolnai +12
Ion implantation has been a key technology for the controlled surface modification of materials in microelectronics and generally, for tribology, biocompatibility, corrosion resist…
Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry
Deshabrato Mukherjee, Benjamin Kalas, Sven Burger +4
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschma…
The composition and structure of the ubiquitous hydrocarbon contamination on van der Waals materials
András Pálinkás, György Kálvin, Péter Vancsó +10
The behavior of single layer van der Waals (vdW) materials is profoundly influenced by the immediate atomic environment at their surface, a prime example being the myriad of emerge…
Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration
T. Lohner, E. Agócs, P. Petrik +8
In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating comp…