Nanothermal Characterization of Amorphous and Crystalline Phases in Chalcogenide Thin Films with Scanning Thermal Microscopy
arXiv:1406.4741 · doi:10.1063/1.4895493
Abstract
The thermal properties of amorphous and crystalline phases in chalcogenide phase change materials (PCM) play a key role in device performance for non-volatile random-access memory. Here, we report the nanothermal morphology of amorphous and crystalline phases in laser pulsed GeTe and Ge2Sb2Te5 thin films by scanning thermal microscopy (SThM). By performing SThM measurements and applying quantitative physical models to two film thicknesses, the PCM thermal conductivities and thermal boundary conductances between the PCM and SThM probe are independently estimated for the amorphous and crystalline phase of each stoichiometry.
References in corpus (4)
- Nanoscale spatial resolution probes for Scanning Thermal Microscopy of solid state materials
- Nanothermal Characterization of Amorphous and Crystalline Phases in Chalcogenide Thin Films with Scanning Thermal Microscopy
- Quantum optomechanics with a high-frequency dilational mode in thin dielectric membranes
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Cited by in corpus (3)
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- Nanothermal Characterization of Amorphous and Crystalline Phases in Chalcogenide Thin Films with Scanning Thermal Microscopy
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