Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy
arXiv:1406.1389 · doi:10.1016/j.ultramic.2014.08.002
Abstract
Low dose electron imaging applications such as electron cyro-microscopy are now benefitting from the improved performance and flexibility of recently introduced electron imaging detectors in which electrons are directly incident on backthinned CMOS sensors. There are currently three commercially available detectors of this type: the Direct Electron DE 20, the FEI Falcon II and the Gatan K2 Summit. These have different characteristics and so it is important to compare their imaging properties carefully with a view to optimising how each is used. Results at 300 keV for both the modulation transfer function (MTF) and detective quantum efficiency (DQE) are presented. Of these, the DQE is the most important in the study of radiation sensitive samples where detector performance is crucial. We find that all three detectors have a better DQE than film. The K2 Summit has the best DQE at low spatial frequencies but with increasing spatial frequency its DQE falls below that of the Falcon II.
9 pages, 5 figures
Cited by in corpus (14)
- Very-High Dynamic Range, 10,000 frames/second Pixel Array Detector for Electron Microscopy
- Imaging Atomic-Scale Chemistry from Fused Multi-Modal Electron Microscopy
- Free-electron interactions with photonic GKP states: universal control and quantum error correction
- Using Electron Energy-Loss Spectroscopy to Measure Nanoscale Electronic and Vibrational Dynamics in a TEM
- Benefits of direct electron detection and PCA for EELS investigation of organic photovoltaics materials
- Real-Time Tilt Undersampling Optimization during Electron Tomography of Beam Sensitive Samples using Golden Ratio Scanning and RECAST3D
- Atomic-resolution elemental mapping at cryogenic temperatures enabled by direct electron detection
- Orientation-Adaptive Virtual Imaging of Defects using EBSD
- Quantifying Noise Limitations of Neural Network Segmentations in High-Resolution Transmission Electron Microscopy
- Energy-Resolved EBSD using a Monolithic Direct Electron Detector
- Electron Backscattered Diffraction using a New Monolithic Direct Detector: High Resolution and Fast Acquisition
- Low-dose cryo electron ptychography via non-convex Bayesian optimization
- Distributed Reconstruction Algorithm for Electron Tomography with Multiple-scattering Samples
- Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets