Intensity-Resolved Above Threshold Ionization of Xenon with Short Laser Pulses

Abstract

We present intensity-resolved above threshold ionization (ATI) spectra of xenon using an intensity scanning and deconvolution technique. Experimental data were obtained with laser pulses of 58 fs and central wavelength of 800 nm from a chirped-pulse amplifier. Applying a deconvolution algorithm, we obtained spectra that have higher contrast and are in excellent agreement with characteristic 2 $U_p$ and 10 $U_p$ cutoff energies contrary to that found for raw data. The retrieved electron ionization probability is consistent with the presence of a second electron from double ionization. This recovered ionization probability is confirmed with a calculation based on the PPT tunneling ionization model [Perelomov, Popov, and Terent'ev, Sov. Phys. JETP 23, 924 (1966)]. Thus, the measurements of photoelectron yields and the proposed deconvolution technique allowed retrieval of more accurate spectroscopic information from the ATI spectra and ionization probability features that are usually concealed by volume averaging.

21 pages, 7 figures

References in corpus (2)

• \emph{In situ} measurement of three-dimensional ion densities in focused femtosecond pulses
• Geometry- and diffraction-independent ionization probabilities in intense laser fields: probing atomic ionization mechanisms with effective intensity matching

Cited by in corpus (4)

• Selective enhancement of resonant multiphoton ionization with strong laser fields
• Selective Strong-Field Enhancement and Suppression of Ionization with Short Laser Pulses
• Strong-field photoelectron momentum imaging of OCS at finely resolved incident intensities
• Highly ionized xenon and volumetric weighting in restricted focal geometries