Selection and orientation of different particles in single particle imaging

Abstract

The short pulses of X-ray free electron lasers can produce diffraction patterns with structural information before radiation damage destroys the particle. The particles are injected into the beam in random orientations and they should be identical. However, in real experimental conditions it is not always possible to have identical particles. In this paper we show that the correlation maximization method, developed earlier, is able to select identical particles from a mixture and find their orientations simultaneously.

References in corpus (5)

• Femtosecond Diffractive Imaging with a Soft-X-ray Free-Electron Laser
• X-ray image reconstruction from a diffraction pattern alone
• Cryptotomography: reconstructing 3D Fourier intensities from randomly oriented single-shot diffraction patterns
• Impact of ultrafast electronic damage in single particle x-ray imaging experiments
• The effect of tamper layer on the explosion dynamics of atom clusters