Resonator Power to Frequency Conversion in a Cryogenic Sapphire Oscillator

Abstract

We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator leads to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.

5 pages, 5 figures

References in corpus (2)

• Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators with 1 x 10^-16 frequency instability
• Cryogenic sapphire oscillator with exceptionally high long-term frequency stability

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