Measuring Mueller matrix of an arbitrary optical element with a fixed set of polarization optics

Abstract

We have described a novel way to determine the Mueller matrix of any optical element by using projection method. For this purpose, we have used two universal SU(2) gadgets for polarization optics to obtain projection matrix directly from the experiment. Mueller matrix has been determined using the experimentally obtained projection matrix for three known optical elements namely free space, half wave plate and quarter wave plate. Experimental matrices are in good agreement with the corresponding theoretical matrices. The error is minimized as the experimental conditions remains same for all measurements since we have used a fixed set of polarization optics i.e. there is no removal or insertion of an optical component during the experiment.

8 pages, 1 figure and 1 table

References in corpus (3)

• Experimental Polarization State Tomography using Optimal Polarimeters
• Hamilton's turns as visual tool-kit for designing of single-qubit unitary gates
• Measurement of Pancharatnam's phase by robust interferometric and polarimetric methods

Cited by in corpus (4)

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