Extraction of the homogeneous linewidth of a fast spectrally diffusing line

Abstract

We present a simple method to extract the homogeneous linewidth of a single photon emitter line exhibiting fast (down to 1 ns) spectral diffusion (SD). It is based on a recently developed technique using photon correlation measurements on half of the line. Here we show that the SD induced bunching depends on the ratio between the width of the homogeneous line and the spectral diffusion amplitude. Using this technique on a CdSe/ZnSe quantum dot, we investigate the temperature dependence of its fast SD amplitude and its homogeneous excitonic linewidth.

5 pages

References in corpus (5)

• Photonic quantum technologies
• Quantum Memories. A Review based on the European Integrated Project "Qubit Applications (QAP)"
• Giant Optical Non-linearity induced by a Single Two-Level System interacting with a Cavity in the Purcell Regime
• Subnanosecond spectral diffusion measurement using photon correlation
• Defect-free ZnSe nanowire and nano-needle nanostructures

Cited by in corpus (1)

• Resonant optical control of the spin of a single Cr atom in a quantum dot