Strain dependence of bonding and hybridization across the metal-insulator transition of VO2

Abstract

Soft x-ray spectroscopy is used to investigate the strain dependence of the metal-insulator transition of VO2. Changes in the strength of the V 3d - O 2p hybridization are observed across the transition, and are linked to the structural distortion. Furthermore, although the V-V dimerization is well-described by dynamical mean-field theory, the V-O hybridization is found to have an unexpectedly strong dependence on strain that is not predicted by band theory, emphasizing the relevance of the O ion to the physics of VO2.

References in corpus (8)

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Cited by in corpus (7)

• Direct Observation of Decoupled Structural and Electronic Transitions and an Ambient Pressure Monoclinic-Like Metallic Phase of VO${}_2$
• Large epitaxial bi-axial strain induces a Mott-like phase transition in VO2
• Photoemission evidence for crossover from Peierls-like to Mott-like transition in highly strained VO${}_2$
• Transport behavior and electronic structure of phase pure VO2 thin films grown on c-plane sapphire under different O2 partial pressure
• Resonant soft x-ray emission as a bulk probe of correlated electron behavior in metallic Sr${}_x$Ca${}_{1-x}$VO${}_3$
• Observation of weakened V-V dimers in the monoclinic metallic phase of strained VO2
• Atomically-Smooth Single-Crystalline VO${}_2$ thin films with Bulk-like Metal-Insulator Transitions