Measurement of the coupling between applied stress and magnetism in a manganite thin film

Abstract

We measured the magnetization depth profile of a (La1-xPrx)1-yCayMnO3 (x = 0.60\pm0.04, y = 0.20\pm0.03) film as a function of applied bending stress using polarized neutron reflectometry. From these measurements we obtained a coupling coefficient relating strain to the depth dependent magnetization. We found application of compressive (tensile) bending stress along the magnetic easy axis increases (decreases) the magnetization of the film.

References in corpus (3)

• Complexity in Strongly Correlated Electronic Systems
• Magnetic non-uniformity and thermal hysteresis of magnetism in a manganite thin film
• Single domain to multi-domain transition due to in-plane magnetic anisotropy in phase separated (La${}_{0.4}$Pr${}_{0.6}$)${}_{0.67}$Ca${}_{0.33}$MnO${}_3$ thin films

Cited by in corpus (5)

• Prediction of giant mechanocaloric effects in fluorite-structured superionic materials
• Interfacial Magnetism in Complex Oxide Heterostructures Probed by Neutrons and X-rays
• Manipulation of the magnetic order parameter and the metal-insulator-transition of a manganite thin film with applied elastic stress
• Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films
• Multi-Fields Modulation of Physical Properties of Oxide Thin Films