Normal metal - superconductor decoupling as a source of thermal fluctuation noise in transition-edge sensors
arXiv:1111.4098 · doi:10.1063/1.4745908
Abstract
We have studied the origin of excess noise in superconducting transition-edge sensors (TES) with several different detector designs. We show that most of the observed noise and complex impedance features can be explained by a thermal model consisting of three bodies. We suggest that one of the thermal blocks and the corresponding thermal fluctuation noise arises due to the high-frequency thermal decoupling of the normal and superconducting phase regions inside the TES film. Our results are also consistent with the prediction that in thin bilayer proximitized superconductors, the jump in heat capacity at the critical temperature is smaller than the universal BCS theory result.
11 pages 14 figures
References in corpus (5)
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Cited by in corpus (6)
- A Review of X-ray Microcalorimeters Based on Superconducting Transition Edge Sensors for Astrophysics and Particle Physics
- Complex impedance, responsivity and noise of transition-edge sensors: analytical solutions for two- and three-block thermal models
- Voltage Fluctuations in ac Biased Superconducting Transition-Edge Sensors
- Crossover between electron-phonon and boundary resistance limited thermal relaxation in copper films
- Transition-Edge Sensors for cryogenic X-ray imaging spectrometers
- Effect of a thin AlO_x layer on transition-edge sensor properties