Giant Flexoelectric Effect in Ferroelectric Epitaxial Thin Films
arXiv:1106.3792 · doi:10.1103/PhysRevLett.107.057602
Abstract
We report on nanoscale strain gradients in ferroelectric HoMnO3 epitaxial thin films, resulting in a giant flexoelectric effect. Using grazing-incidence in-plane X-ray diffraction, we measured strain gradients in the films, which were 6 or 7 orders of magnitude larger than typical values reported for bulk oxides. The combination of transmission electron microscopy, electrical measurements, and electrostatic calculations showed that flexoelectricity provides a means of tuning the physical properties of ferroelectric epitaxial thin films, such as domain configurations and hysteresis curves.
Accepted by Phys. Rev. Lett
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Cited by in corpus (42)
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