Controlling the quality factor of a tuning-fork resonance between 9 K and 300 K for scanning-probe microscopy
arXiv:1103.5892 · doi:10.1088/0022-3727/44/37/375502
Abstract
We study the dynamic response of a mechanical quartz tuning fork in the temperature range from 9 K to 300 K. Since the quality factor Q of the resonance strongly depends on temperature, we implement a procedure to control the quality factor of the resonance. We show that we are able to dynamically change the quality factor and keep it constant over the whole temperature range. This procedure is suitable for applications in scanning probe microscopy.
5 pages, 6 figures
References in corpus (4)
- Advances in atomic force microscopy
- Quartz Tuning Fork: Thermometer, Pressure- and Viscometer for Helium Liquids
- Dynamics of quartz tuning fork force sensors used in scanning probe microscopy
- Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy