Control of defect-mediated tunneling barrier heights in ultrathin MgO films
arXiv:1010.2473 · doi:10.1063/1.3531652
Abstract
The impact of oxygen vacancies on local tunneling properties across rf-sputtered MgO thin films was investigated by optical absorption spectroscopy and conducting atomic force microscopy. Adding O to the Ar plasma during MgO growth alters the oxygen defect populations, leading to improved local tunneling characteristics such as a lower density of current hotspots and a lower tunnel current amplitude. We discuss a defect-based potential landscape across ultrathin MgO barriers.
4 pages, 4 figures
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