117 citations · 326 across the 6 of their papers we have counts for
6 papers
A New Method for Characterizing Bulk and Surface Conductivities of Three-Dimensional Topological Insulators: Inverted Resistance Measurements
Y. S. Eo, K. Sun, Ç. Kurdak +2
We introduce a new resistance measurement method that is useful in characterizing materials with both surface and bulk conduction, such as three-dimensional topological insulators.…
Control of defect-mediated tunneling barrier heights in ultrathin MgO films
D. J. Kim, W. S. Choi, F. Schleicher +9
The impact of oxygen vacancies on local tunneling properties across rf-sputtered MgO thin films was investigated by optical absorption spectroscopy and conducting atomic force micr…
Domain wall motion in epitaxial Pb(Zr,Ti)O3 capacitors investigated by modified piezoresponse force microscopy
S. M. Yang, J. Y. Jo, D. J. Kim +5
We investigated the time-dependent domain wall motion of epitaxial PbZr0.2Ti0.8O3 capacitors 100 nm-thick using modified piezoresponse force microscopy (PFM). We obtained successiv…
Composition-dependent polarization switching behaviors of (111)-preferred polycrystalline Pb(Zr_{x}Ti_{1-x})O_{3} thin films
J. Y. Jo, S. M. Yang, H. S. Han +8
We investigated the time-dependent polarization switching behaviors of (111)-preferred polycrystalline Pb(ZrxTi1-x)O3 thin films with various Zr concentrations. We could explain al…
Observation of inhomogeneous domain nucleation in epitaxial Pb(Zr,Ti)O3 capacitors
D. J. Kim, J. Y. Jo, T. H. Kim +4
We investigated domain nucleation process in epitaxial Pb(Zr,Ti)O3 capacitors under a modified piezoresponse force microscope. We obtained domain evolution images during polarizati…
Ferroelectric properties of SrRuO3/BaTiO3/SrRuO3 ultrathin film capacitors free from passive lay
Y. S. Kim, J. Y. Jo, D. J. Kim +9
Structural studies on ultrathin SrRuO3/BaTiO3/SrRuO3 capacitors, with BaTiO3 thicknesses of between 5 nm and 30 nm, show well-defined interfaces between ferroelectric BaTiO3 and el…