Dielectric breakdown and avalanches at non-equilibrium metal-insulator transitions
arXiv:1009.4735 · doi:10.1103/PhysRevLett.107.276401
Abstract
Motivated by recent experiments on the finite temperature Mott transition in VO2 films, we propose a classical coarse-grained dielectric breakdown model where each degree of freedom represents a nanograin which transitions from insulator to metal with increasing temperature and voltage at random thresholds due to quenched disorder. We describe the properties of the resulting non-equilibrium metal-insulator transition and explain the universal characteristics of the resistance jump distribution. We predict that by tuning voltage, another critical point is approached, which separates a phase of "bolt"-like avalanches from percolation-like ones.
4 pages, 3 figures
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- Separating electric field and thermal effects across the metal-insulator transition in vanadium oxide nanobeams
- Proliferation of metallic domains caused by inhomogeneous heating near the electrically-driven transition in VO nanobeams
- Feedback induced phase transitions in active porous media
- Nonequilibrium thermal state of a voltage-biased Mott insulator
- Planar 2-D Cracks And Inclusions In Elastic Media