A digital oscilloscope setup for the measurement of a transistor's characteristics
arXiv:1006.0954 · doi:10.1119/1.3493628
Abstract
The measure of the characteristics of a transistor is an important step in an introductory electronics course. We propose to use a digital oscilloscope with a USB connection to perform a measurement of the characteristic curves with no additional custom circuitry. The setup is presented alongside with code that allows the importation and analysis of the results with open-source software.
4 pages, 7 figures. Data files and program files available upon request, contact info at: http://homepages.ulb.ac.be/~pdebuyl/